Pattern Recognition with Supplementary Information

LanguageJapanese
TypeJournal Articles
AuthorsMasakazu Iwamura, Seiichi Uchida, Shinichiro Omachi, Koichi Kise
TitlePattern Recognition with Supplementary Information
JournalTrans. IEICE
Vol.J90-D
No.2
Pagespp.460-470
ReviewedReviewed
DateFebruary 2007
Research fieldsPattern recognition
URLhttp://search.ieice.org/bin/summary.php?id=j90-d_2_460
KeyIwamura2007_IEICE (id=958)

Abstract

In this paper, we introduce a new model in which the classifier receives not only a pattern itself but also supplementary information that assists recognition. This model can greatly improve recognition performance with a few bits of information. For practical use of pattern recognition, rejection is one of the most important operations. The proposed model also can reduce error rates by rejection. How to assign such information is described, and possible recognition rates are estimated. The proposed model will enable us to achieve an arbitrary recognition rate with an arbitrary rejection rate with certain bits of supplementary information required.

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PDF file is available at IEICE Transactions online (in Japanese).

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